SPECTRUM: Synergistic Precision Extraction and Chart Transformation Tool for Robust Unified Power SeMiconductor (IGBT) Datasheet
Published in EExPolytech, 2025
This work develops SPECTRUM, a deep learning-based system using Cascade R-CNN and Mask2Former to automatically extract and analyze MOSFET/IGBT characteristic curves from datasheets, with MLLM validation for improved reliability.
Recommended citation: Wang, J.*, Jiang, H.*, Wang, J., Chen, R., Zhuang, C., & Song, J. (2025). "SPECTRUM: Synergistic Precision Extraction and Chart Transformation Tool for Robust Unified Power SeMiconductor (IGBT) Datasheet." submitted to EExPolytech. #