GRAIN: A Design-Intent-Driven Interactive Analog Layout Migration Framework
Published in Design, Automation and Test in Europe (DATE), 2025
This paper presents GRAIN, a design-intent-driven interactive analog layout migration framework that preserves layout intent via DBSCAN-based clustering and intra/inter-cluster compaction. The framework achieves 45.4% performance improvement in 65nm→40nm/28nm migrations while maintaining routing features through abstract-path-guided maze routing.
Recommended citation: Liu, B.*, Jiang, H.*, Zhang, H., Gao, X., Kong, Z., Tang, X., Wang, R., & Lin, Y. (2025). "GRAIN: A Design-Intent-Driven Interactive Analog Layout Migration Framework." submitted to Design, Automation and Test in Europe (DATE). #